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Accelerated Life Testing and Reliability of High K Multilayer Ceramic Capacitors

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1 Author(s)
Minford, W.J. ; Bell Laboratories, Allentown, PA

The reliability of high K muitilayer ceramic capacitors was evaluated using accelerated life testing. The degradation in insulation resistance was characterized as a function of voltage (two to eight times rated) and temperature (85 to 170°C). The times to failure at a voltage-temperature stress conformed to a iognormai distribution with a standard deviation typically less than 0.5. A small infant mortality population was also observed for some samples. The results were least-squares fit to the following equation:

Published in:

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on  (Volume:5 ,  Issue: 3 )

Date of Publication:

Sep 1982

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