Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

The Failure Mode and Lifetime of Static Contacts

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Takano, E. ; Tohoku University,Japan ; Mano, K.

This paper describes the failure mode due to corrosion at the contacting surfaces of static contacts in connectors and mechanical wiring connections. Copper static contacts with no mechanical separation fail to maintain electrical continuity when temperature-cycled from 20 to 200°C. Electron diffraction analysis and microscopic inspection show that this failure mode is due to growth of Cu2O film over all or part of the contacting surfaces. The lay? between the contact members is estimated to be 15 to 3250 A thick and the lifetime of the copper static contact at light loads is proportional to load.

Published in:

Parts, Materials and Packaging, IEEE Transactions on  (Volume:4 ,  Issue: 2 )