Cart (Loading....) | Create Account
Close category search window
 

Noise Measurements of Composition Resistors; Part I. The Method and Equipment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

Voltage fluctuations due to direct current flowing in composition resistors have been measured with a National Bureau of Standards experimental test set. A second group of measurements were made as prescribed in the JAN-R-11 Specification. The two measuring systems are described and test results compared. Several groups of commercial resistors of different manufacture have been measured and the results analyzed and compared. Background theory is included.

Published in:

Component Parts, IRE Transactions on  (Volume:4 ,  Issue: 1 )

Date of Publication:

Nov 1955

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.