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Reliability evaluation tests for multilayer ceramic chip capacitors mounted on a hybrid IC were implemented. Failure modes, failure mechanisms, and drift of characteristics were analyzed. Humidity acceleration as well as voltage and temperature accelerations were investigated to estimate the chip capacitor reliability. The chip capacitor reliability proved to be high and adequate for the service period of the communication system.
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on (Volume:1 , Issue: 3 )
Date of Publication: Sep 1978