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Browse Journals & Magazines > Components, Hybrids, and Manu ...> Volume:1 Issue:3 Help

Reliability Evaluation and Failure Analysis for Multilayer Ceramic Chip Capacitors

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3 Author(s)
Kobayashi, T. ; NTT public Corp.,Tokyo, Japan ; Ariyoshi, H. ; Masuda, A.

Reliability evaluation tests for multilayer ceramic chip capacitors mounted on a hybrid IC were implemented. Failure modes, failure mechanisms, and drift of characteristics were analyzed. Humidity acceleration as well as voltage and temperature accelerations were investigated to estimate the chip capacitor reliability. The chip capacitor reliability proved to be high and adequate for the service period of the communication system.

Published in:
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on  (Volume:1 ,  Issue: 3 )

Date of Publication: Sep 1978

Page(s):
316 - 324
ISSN :
0148-6411
Digital Object Identifier :
10.1109/TCHMT.1978.1135275
Product Type:
Journals & Magazines
Date of Current Version :
06 January 2003
Issue Date :
Sep 1978
Sponsored by :
IEEE Components, Packaging, and Manufacturing Technology Society

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