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On the Interpretation of Noise in Thick-Film Resistors

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3 Author(s)
Ringo, J.A. ; Washington State University,Pullman, WA ; Stevens, E.H. ; Gilbert, D.

Noise in thick-film resistors is interpreted by comparison to experimental and theoretical results previously reported for noise in metals and semiconductors. This comparison provides an explanation for the observed dependence of noise on the thick-film-resistor geometry and the 100-fold increase-in noise amplitude over that of metals and semiconductors This comparison indicates that mobile-charge interactions with traps are an inherent feature of charge transport in thick-film resistors.

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Parts, Hybrids, and Packaging, IEEE Transactions on  (Volume:12 ,  Issue: 4 )