Cart (Loading....) | Create Account
Close category search window
 

Lead iodide platelets: correlation between surface, optical, and electrical properties with X- and γ-ray spectrometric performance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Fornaro, L. ; Fac. of Chem., Univ. of Uruguay, Montevideo, Uruguay ; Saucedo, Edgardo ; Mussio, L. ; Gancharov, A.
more authors

Lead iodide platelets grown by physical-vapor deposition were characterized by several properties related to spectrometric performance. Platelets were grown from both synthesized lead iodide without purification, and purified by repeated evaporation. The growth was performed by heating the starting material under vacuum (10-5 mm Hg) or in high-purity Ar atmosphere (500 mm Hg) at temperatures from 390 to 440°C, for 10 to 25 days. Platelets grew at 200-250°C and perpendicular to the ampoule wall. Platelet size is up to 13×8 mm2, and their thickness is from 50 to 100 μm. The crystals were characterized by optical microscopy, atomic force microscopy, scanning electron microscopy, and low temperature photoluminescence. These characterizations showed that platelets have an exceptional transparence, that they grew from hexagonal grains, and that their surface has a mean roughness in the range from 1.1 to 4.7 nm. Low-temperature photoluminescence peak position and broadness confirmed the high purity of the starting material, and bands confirmed strong components from free and bonded excitons and low superficial imperfections. Electrical properties were measured by making radiation detectors with front palladium thermal deposition contacts and acrylic encapsulation. Resistivity values up to 4×1013 Ω.cm and current density values as low as 288 pA/cm2 (20 V) were obtained. X-ray spectrometry was performed with lead iodide detectors, and an energy resolution of 1.8 keV was achieved for the 241Am 14 keV radiation. Correlation between optical and surface properties, electrical parameters, and detector performance are presented. Also, the different results were compared with previous ones for lead iodide crystals grown by other methods and with alternative materials.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:49 ,  Issue: 6 )

Date of Publication:

Dec 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.