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Comparison of heavy ion and proton-induced single event effects (SEE) sensitivities

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5 Author(s)
Koga, R. ; Aerosp. Corp., Los Angeles, CA, USA ; Yu, P. ; Crawford, K. ; Crain, S.
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Proton-induced single event effects of a set of microcircuits are compared with effects due to heavy ions. Even though some microcircuits show a relatively high sensitivity to heavy ions, they do not have a corresponding sensitivity to protons.

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Nuclear Science, IEEE Transactions on  (Volume:49 ,  Issue: 6 )