By Topic

Dielectric Measurements of Millimeter-Wave Materials

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

It is no longer necessary to use extrapolated microwave dielectric data when designing millimeter-wave components, devices, and systems. Precision measurements can now be made to generate highly accurate millimeter-wave (5 to 1/2 mm) continuous spectra on complex refractive index, complex dielectric permittivity, and loss tangent for a variety of materials such as common ceramics, semiconductors, crystalline, and glassy materials. The continuous spectra reveal an increase in dielectric loss with increase in frequency in this wavelength range for most materials. Reliable measurements also reveal that the method of preparation of nominally identical specimens can change the dielectric losses by many factors. These broad-band measurements were carried out employing dispersive Fourier transform spectroscopy applied to a modular two-beam polarization interferometer. Data obtained with Fabry-Perot open resonator methods at wavelengths of 5 mm and longer will also be compared.

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:32 ,  Issue: 12 )