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Microwave Measurements of GaAs Integrated Circuits Using Electrooptic Sampling

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5 Author(s)

We describe the electrooptic sampling system at Stanford with emphasis on the requirements for microwave measurements. Results presented include internal-node measurements of 20 GHz distributed amplifiers, propagation delays in GaAs frequency dividers clocked to 18 GHz, and VSWR on IC transmission lines to 40 GHz.

Published in:

Microwave Symposium Digest, 1987 IEEE MTT-S International  (Volume:2 )

Date of Conference:

May 9 1975-June 11 1987