Cart (Loading....) | Create Account
Close category search window
 

Optical Fiber and Preform Profiling Technology

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

A comprehensive review of state-of-tie-art optical fiber and preform index-profiling methods has been prepared. The advantages and disadvantages of the various approaches are discussed. Important parameters include measurement accuracy, resolution, simplicity, and the nondestructive features of some methods. Both optical and non-optical techniques have been treated. Resolution considerations probably favor the refracted near-field technique and this may be a decisive factor for the measurement of single-mode fibers. Simplicity of apparatus lies with near-field methods generally so that the bound near-field method is most often used for dimensioned measurements. Preform profiling is dominated by deflection function methods, usually accompanied by spatial filtering or focusing. Methods restricted to certain classes of fiber, such as the far-field approaches, are less attractive and, consequently, do not receive as much use.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:30 ,  Issue: 10 )

Date of Publication:

Oct. 1982

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.