By Topic

A Resonance Method for the Broad-Band Characterization of General Two-Port Microstrip Discontinuities

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

The paper describes an experimental procedure suitable for broad-band characterization of two-port microstrip discontinuities of any topology. The resonance frequencies of a transmission-type cavity embedding the discontinuity under test and of a set of reference fines are measured and computer processed to obtain the scattering parameters the discontinuity itself. This method features extreme ease of application thanks to the limited number and simple topology of the required microstrip samples, as well as highly accurate and repeatable results. Furthermore, the scattering matrices obtained from the measurement are automatically normalized with respect to the wave impedances of the qnasi-TEM modes in the outgoing microstrips. This makes possible an analysis and design approach not requiring the knowledge or calculation of microstrip characteristic impedances.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:29 ,  Issue: 7 )