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An entirely new method for measuring dielectric properties of slab-type materials is developed by using a novel dielectric waveguide structure originally designed for millimeter-wave integrated circuits. The method entails the measurement of the stopband of the grating structure created in the dielectric waveguide. Several examples of measurement results are reported.
Microwave Theory and Techniques, IEEE Transactions on (Volume:27 , Issue: 10 )
Date of Publication: Oct 1979