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An Improved Computational Method for Noise Parameter Measurement

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2 Author(s)

Conventional methods for noise parameter measurement for linear noisy two-ports have been improved by introducing a computational method for evaluating measured admittance errors. Derivation and comparison with a conventional method are given. Noise parameters of a packaged 0.5-mu m gate-length GaAs MESFET (NE38806) were successfully measured using the proposed technique.

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Microwave Theory and Techniques, IEEE Transactions on  (Volume:27 ,  Issue: 6 )