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Excess Surface Resistance Due to Surface Roughness at 35 GHz

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1 Author(s)

The increase of the surface resistance of plane copper surfaces caused by mechanically generated surface roughness has been determined at 35 GHz by measuring and evaluating the Q values of an H-guide cavity with removable sidewalls. The sidewalls were ground one-directionally by using abrasive papers of various grades to produce various degrees of roughness. The rms values of roughess were measured mechanically and optically after calibration by microphotography.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:22 ,  Issue: 5 )

Date of Publication:

May 1974

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