Cart (Loading....) | Create Account
Close category search window

Microwave Measurement of a Complex Dielectric Constant Over a Wide Range of Values by Means of a Waveguide-Resonator Method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

A new method of measuring complex dielectric constants at microwave frequencies by introducing a resonant circuit comprised of the experimental sample within a waveguide is described. The theoretical evaluation of working equations for the complex dielectric constant under the quasi-stationary distribution of the field within the sample is given. In this case, the equations are derived 1) considering the elements as lumped parameters and 2) distributed parameters are treated by means of transmission line equations. The two sets of equations are compared. The working equations are also derived for the condition when the experimental sample takes up the form of a radial line. The accuracy of determining the parameters is computed and experimental results are provided as verification of the applicability of the given method.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:22 ,  Issue: 4 )

Date of Publication:

Apr 1974

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.