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Computation of Dielectric Properties from Short-Circuited Waveguide Measurements on High- or Low-Loss Materials (Computer Program Descriptions)

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1 Author(s)

Computation of the relative complex permittivity components εr' and εr'' loss tangent, and conductivity from measurements data on materials in coaxial, rectangular, or cylindrical waveguides.

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Microwave Theory and Techniques, IEEE Transactions on  (Volume:22 ,  Issue: 3 )