By Topic

Measurement of Dielectric Materials Using a Cutoff Circuiar-Waveguide Cavity (Short Papers)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

A technique is presented for accurately determinhg the dielectric constant of microwave materials. The concept is to resonate a cutoff circular-waveguide cavity by inserting the dielectric-disk sample. Unlike most dielectric measurement techniques which rely on perturbation methods, this one determines the dielectric constant from the absolute measurement of the resonant frequency. Also, the use of a cutoff cavity prevents false dielectric constant readings by eliminating spurious resonances.

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:20 ,  Issue: 3 )