Cart (Loading....) | Create Account
Close category search window
 

Automated Test Equipment for Phased-Array Modules

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

A computer-controlled production test system for air-borne phased-array microwave modules is described. In the transmit mode accurate measurements of module output power and phase as a function of input power and frequency are made automatically on a pulse basis, and with 4:1 frequency translation from module input to output. Module receiver gain, IF output phase, and noise figure are measured as a function of frequency and local oscillator input power in the receive mode. Other measurements under computer control include dc levels, input and output VSWRS, gain compression, output pulse characteristics, spurious levels, and spectral purity. All test parameters are automatically compared to unit-specification limits as well as reference-standard (unit-to-unit) limits. The system errors are measured periodically through use of calibration standards, stored in memory, and applied as corrections to the measured data on the module under test. Input power, derived from a coherent microwave synthesizer, is automatically adjusted to the required level prior to each test. All test data are recorded on magnetic tape and available to the operator by means of a line printer when desired. The module test fixture incorporates precision (APC)-7 to module adapters, dc connections, an array simulator, and temperature control.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:20 ,  Issue: 1 )

Date of Publication:

Jan 1972

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.