Cart (Loading....) | Create Account
Close category search window
 

A Broad Tunable Bandwidth Traveling-Wave Maser

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

A new type of traveling-wave maser (TWM) has been developed, employing the meander line as the slow-wave circuit and rutile as the active maser crystal. This amplifier has achieved net gains in excess of 23 db across the band from 2.0 to 3.0 Gc, with an over-all noise temperature of 8° ± 2°K. This marks the first time that rutile with a dielectric constant of 220 has been coupled to a slow-wave circuit. The maser material exhibited inversion ratios of 10:1 and saturated at an input signal of -47 dbm. In addition to the maser work, a ferrite material investigation was conducted, which led to the development of a gadolinium substituted yttrium iron garnet (YIG) as the ferrite isolator. Various concentrations of the gadolinium in YIG were investigated as ferrite isolators at 4.2°K and were found to have lower forward losses than pure YIG at S band.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:12 ,  Issue: 4 )

Date of Publication:

Jul 1964

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.