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Integrated design and test generation under internet based environment MOSCITO

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3 Author(s)
Schneider, A. ; Fraunhofer Inst. for Integrated Circuits ; Ivask, E. ; Ubar, R.

This paper describes an environment for internet-based collaboration in the field of design and test of digital systems. Automatic Test Pattern Generation (ATPG) and fault simulation tools at behavioral, logical and hierarchical levels available at geographically different places running under the virtual environment using the MOSCITO system are presented The interfaces between the integrated tools and also commercial design tools were developed. The tools can be used separately, or in multiple applications in different design and test flows. The functionality of the integrated design and test system was verified in several collaborative experiments over internet by partners locating in different geographical sites.

Published in:

Digital System Design, 2002. Proceedings. Euromicro Symposium on

Date of Conference:

2002