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Just-in-time methods for semiconductor manufacturing

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2 Author(s)
Levitt, M.E. ; Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA ; Abraham, J.A.

A method is presented that allows job shops, such as wafer fabrication lines (fabs), to be analyzed for the application of just-in-time (JIT) production methods. From the resources available and the process recipe, a Kanban policy is derived that allows a pull-type production system to be implemented. Using this method example fabs were analyzed and the JIT/Kanban policies derived were simulated. The simulations show that the proposed method performs very well compared to other fab scheduling policies

Published in:

Advanced Semiconductor Manufacturing Conference and Workshop, 1990. ASMC 90 Proceedings. IEEE/SEMI 1990

Date of Conference:

11-12 Sep 1990

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