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Routh-Hurwitz test under vanishing leading array elements

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1 Author(s)
Yeung, K. ; Chinese University of Hong Kong, Shatin, Hong Kong

A slight modification to construct Routh's array is presented to cope with the special case of vanishing leading array elements. By means of the modified array, root locations of a polynomial can readily be determined through counting first-column sign changes, as is with the normal Routh's test, without the necessity, of adopting the ε-approach.

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Automatic Control, IEEE Transactions on  (Volume:28 ,  Issue: 1 )