Cart (Loading....) | Create Account
Close category search window
 

Analytic design of adaptive sampling control law in sampled-data systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Hsia, T.C. ; University of California, Davis, CA, USA

A unified analytic approach is presented for the design of adaptive sampling control law in sampled-data systems. This is accomplished by introducing an objective function which measures the performance of the sampler over each sampling interval, and then minimize it to obtain the sampling control law. A total of six different control laws, which are functions of the sampled function, are derived from the generalized objective function by selecting different weighting coefficients. More than half of these control laws are identical to existing results. Similar control laws as functions of the system output can be derived as well. Also included are some experimental results on the performances of four representative control laws in a second-order system subject to step disturbance.

Published in:

Automatic Control, IEEE Transactions on  (Volume:19 ,  Issue: 1 )

Date of Publication:

Feb 1974

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.