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Novel self-convergent programming method using source-induced band-to-band hot electron injection

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5 Author(s)
Liyang Pan ; Inst. of Microelectron., Tsinghua Univ., Beijing, China ; Jun Zhu ; Zhihong Liu ; Ying Zeng
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The authors describe a novel self-converging programming method using the source-induced band-to-band hot electron (SIBE) injection. This method features low current, high speed, and good reliability, and automatically converges at the desired threshold voltage state without any conventional verification operations. The programming leakage current of this method is only about 3 μA/μm, and the programming time is as low as 30 μs. A threshold voltage model is also proposed and shows good consistency with measured results.

Published in:

Electron Device Letters, IEEE  (Volume:23 ,  Issue: 11 )