By Topic

Evaluation of a model for prebreakdown at the cathode in a DC-stressed liquid

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Pace, M.O. ; Dept. of Electr. & Comput. Eng., Tennessee Univ., Knoxville, TN, USA ; Alexeff, I. ; Wintenberg, A.L. ; Blalock, T.V.

A nonlinear model is simulated for a partial discharge, or low density region (LDR), at a DC-stressed needle cathode in hexane for several ambient pressures from subatmospheric to 3 atm. It assumes a void driven in the liquid from the cathode by electrical force on the void's charged liquid boundary (LDR wall). The effects of varying certain parameters on the simulation results are discussed. Simulation results are compared with earlier experimental values of LDR size, pulse charges, and pulse duration as functions of time and pressure. The results suggest that the LDR is driven by electrical pressure which is initially much larger than typical ambient pressures but which drops during the LDR expansion to below ambient pressure, resulting in the demise of the LDR. Current pulses are then produced as a result of the expansion (rather than being its cause), and they serve as externally detectable telemetry signals characterizing the LDR state without invading it. The pulses result when the LDR grows and its trapped charge spreads over larger wall area, changing the LDR wall potential

Published in:

Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on

Date of Conference:

3-6 Jun 1990