By Topic

Technology 1992-test and measurement

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

Noteworthy developments during 1991 are summarized. The rise of RISC put new demands on logic analyzers. Instruments relied less on PCs and more on multiple microprocessors for intelligence. Testability issues continued to grow in importance, with a strong focus on boundary scan methods. In the standards area, work continued on intrinsic, or quantum, standards, with ion cooling and laser trapping coming to the fore as promising techniques

Published in:

Spectrum, IEEE  (Volume:29 ,  Issue: 1 )