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Model-based, multiple-fault diagnosis of dynamic, continuous physical devices

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1 Author(s)
Hwee Tou Ng ; Texas Univ., Austin, TX, USA

A diagnosis algorithm called Inc-Diagnose that can generate diagnosis candidates incrementally and detect multiple faults is presented. It models continuously changing device states using a discrete set of Qsim qualitative states over time. Inc-Diagnose is a modification of R. Reiter's algorithm (Artif. Intell., vol.32., no.1, p.57-95, 1987), the theory of which is reviewed. An example diagnosis is given.<>

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IEEE Expert  (Volume:6 ,  Issue: 6 )