Cart (Loading....) | Create Account
Close category search window

A Theoretical Synchronization System for Use with Noisy Digital Signals

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Van Horn, J. ; Adler-Westrex Division of Litton Systems, Inc., New Rochelle, NY, USA

A synchronization system for use with noisy digital signals and a theoretical analysis of its operation is given. The system uses bit-by-bit correlation of the random bit stream input to determine synchronization error. The contention is that any periodically varying signal may be correlated period-by-period to find relative period synchronization. No knowledge of the information content of the signal is required. As conceived, this system is applicable to any random function which has periodicity. Since it uses correlation, it will enable synchronization in relatively low signal-to-noise ratio systems. The paper is a comparative analysis of periodic crosscorrelation detection vs. periodic integration of a diphase (Manchester) coded signal of fixed period and random digits.

Published in:

Communication Technology, IEEE Transactions on  (Volume:12 ,  Issue: 3 )

Date of Publication:

September 1964

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.