Referenced Items are not available for this document.
When pseudorandom patterns generated by a linear feedback shift register (LFSR) are used as test stimuli, there is always a concern about the linear dependencies within the sequence of patterns. It is possible for these linear dependencies to preclude a specific test pattern from being present in the sequence of applied patterns. These dependencies and ways to calculate their effects on a particular test are discussed, with the goal of developing the means of analyzing a digital circuit which is connected to a source of pseudorandom patterns to determine whether or not linear dependencies are encountered by a particular connection
Published in:
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
(Volume:11
,
Issue:
1
)
Date of Publication: Jan 1992
- Page(s):
- 83 - 86
- ISSN :
- 0278-0070
- INSPEC Accession Number:
- 4107754
- Digital Object Identifier :
- 10.1109/43.108621
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Jan 1992
- Sponsored by :
- IEEE Council on Electronic Design Automation
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