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Calculating the effects of linear dependencies in m-sequences used as test stimuli

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1 Author(s)
P. H. Bardell ; IBM Corp., Poughkeepsie, NY, USA

When pseudorandom patterns generated by a linear feedback shift register (LFSR) are used as test stimuli, there is always a concern about the linear dependencies within the sequence of patterns. It is possible for these linear dependencies to preclude a specific test pattern from being present in the sequence of applied patterns. These dependencies and ways to calculate their effects on a particular test are discussed, with the goal of developing the means of analyzing a digital circuit which is connected to a source of pseudorandom patterns to determine whether or not linear dependencies are encountered by a particular connection

Published in:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (Volume:11 ,  Issue: 1 )