By Topic

Noise analysis of switched capacitor networks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

Noise generated in switched capacitor (SC) networks has its origin in the thermal fluctuations of charged particles in the channels of the MOS switch transistors on one hand, in the operational amplifiers on the other hand. Using a SC integrator as vehicle, it is shown that the output noise spectrum consists in general of a broad-band component due to a continuous-time noise signal and of a narrow-band contribution predominating in the baseband of the SC network resulting from a sampled-data noise signal. The ratio of undersampling is introduced and it is shown that the latter noise contribution can be evaluated by sampled-data techniques using thez-transform transfer function. These results are applied to the SC integrator and excellent concordance to the measurements made on a laboratory model is established.

Published in:

Circuits and Systems, IEEE Transactions on  (Volume:30 ,  Issue: 1 )