By Topic

Vacuum ion source diagnostics at the Tokyo Institute of Technology

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
K. Kasuya ; Dept. of Energy Sci., Tokyo Inst. of Technol., Kanagawa, Japan ; K. Horioka

After a brief review of various diagnostics for vacuum ion sources measured data are presented for the particle distributions within the anode/cathode gap regions using passive spectroscopy, active laser interferometry, and resonant laser-induced fluorescence, while the extracted ion beams were observed by particle track detectors of both time-integrated and time-resolved types. Also measured were the prompt gamma-rays and the D-D neutrons when the beams hit the targets. The experimental arrangements of these diagnostics, together with some examples of the typical results obtained, are shown. It is discussed how various kinds of particles were distributed within the ion diodes, and how they were extracted from the source regions

Published in:

IEEE Transactions on Plasma Science  (Volume:19 ,  Issue: 5 )