Cart (Loading....) | Create Account
Close category search window

Analysis of linear 3-port 4-terminal networks with applications to distributed circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

The 2-port parameters of 4-terminal networks are often known. It is then simpler to supplement them rather than carry out a renewed complete analysis. A method is described for the analysis of linear reciprocal timeinvariant networks in terms of three parameters characterizing their behavior with respect to two disjoint ports and three further "balance" parameters, which are essentially open-circuit admittance parameters, thereby giving a complete description of 3-port 4-terminal networks. In the transmission line case the balance parameters are obtained as solutions of two-point boundary value problems, which in most common applications have simple solutions. The effects of parallel, series, and cascade connections of such networks are also investigated and the results can be regarded as generalizations of the cases satisfying the Brune conditions.

Published in:

Circuit Theory, IEEE Transactions on  (Volume:20 ,  Issue: 1 )

Date of Publication:

Jan 1973

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.