Cart (Loading....) | Create Account
Close category search window
 

Reflectivity of mode at facet and oscillation mode in double-heterostructure injection lasers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Ikegami, Tetsuhiko ; NTT, Tokyo, Japan

Reflectivity of a cleaved facet forming a laser cavity in a double heterostructure injection laser is analyzed on the basis of a dielectric waveguide model and the reflectivity of modes is numerically provided for a GaAs-AlGaAs double-heterostructure injection laser. The modes that distinguish field distributions perpendicular to a junction plane are considered up to the sixth order with TE and TM modes. The dependence of threshold conditions on the mode, the relations between the lowest threshold mode and the structures of the injection laser are studied. Provided mode reflectivity is solely responsible for modal selection, the single-mode operation is theoretically shown to be possible by choosing a suitable length of the cavity even though the thickness of the active layer is large.

Published in:

Quantum Electronics, IEEE Journal of  (Volume:8 ,  Issue: 6 )

Date of Publication:

Jun 1972

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.