By Topic

High sensitivity phase and amplitude measurement of low Fourier frequency phenomena

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Rubiola, E. ; ESSTIN, Univ. Henri Poincare, Nancy, France ; Giordano, V.

A substantial progress in understanding the flicker noise mechanism of the interferometric phase noise measurements results in new scheme that improves the sensitivity at low Fourier frequencies by 20-30 dB upon the previous instruments [Rev. Sci. Instr. 73 (6) 2445-2457 (2002)]. The new scheme also features automatic carrier suppression and simplified carrier suppression. Two prototypes have been constructed, designed for the carrier frequency of 100 MHz and 5 MHz, with similar performances. A residual noise of -175 to -180 dB dBrad2/Hz has been obtained at f = 1 Hz off the carrier in real-time measurements, while exploiting the correlation-and-averaging method in similar conditions the sensitivity is some -182 dBrad2/Hz (parallel detection), and -186 dBrad2/Hz (± 45° detection) at f = 1 Hz. A residual white noise of -203 dBrad2/Hz has been obtained at f = 250 Hz off the carrier, while the ultimate noise floor is still limited by the averaging capability of the correlator. The instruments have been tested measuring the noise of by-step attenuators and 180° hybrids, which is below -170 dBrad2/Hz at f = 1 Hz.

Published in:

Frequency Control Symposium and PDA Exhibition, 2002. IEEE International

Date of Conference: