Cart (Loading....) | Create Account
Close category search window
 

Low-threshold current AlGaAs/GaAs-distributed feedback laser grown by two-step molecular beam epitaxy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Kojima, K. ; Mitsubishi Electric Corporation, Hyogo, Japan ; Noda, S. ; Mitsunaga, Kazumasa ; Kyuma, K.
more authors

AlGaAs/GaAs-distributed feedback (DFB) lasers with oxide-stripe structure were fabricated by a two-step molecular beam epitaxial (MBE) growth for the first time. The large coupling coefficient of 90 cm-1and the threshold current as low as 165 mA at room temperature were obtained with the second-order gratings. The characteristic temperature T0was as high as 210 K. Single longitudinal-mode oscillation was observed up toI/I_{th} = 1.5and from 0 to 50°C without any mode hopping. The wavelength variation from device to device was ±5 Å. The dependence of the coupling coefficient on the device structure was calculated, and it was shown that MBE is much more advantageous than LPE to enhance the coupling coefficient.

Published in:

Lightwave Technology, Journal of  (Volume:4 ,  Issue: 5 )

Date of Publication:

May 1986

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.