Cart (Loading....) | Create Account
Close category search window
 

Fault location in optical fibers using optical frequency domain reflectometry

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ghafoori-Shiraz, H. ; Anritsu Corporation, Atsugi-shi, Kanagawa, Japan ; Okoshi, T.

This paper describes the experimental and analytical investigations performed on another backscattering technique named "Optical Frequency Domain Reflectometry" (OFDR). In this approach the temporal signatures of graded-index multimode fibers are obtained as the inverse Fourier transform of the OFDR data. In the employed OFDR system the entire process is automated, and the modulation frequency is changed stepwise to obtain an exact inverse Fourier transform. The effects of starting frequency, frequency increment, and highest modulation frequency on OFDR temporal response are considered. The experimental results are in good agreement with those obtained by computer simulations. Also, a synchronous detection type of filtering process is suggested for signal-to-noise ratio improvement in OFDR technique.

Published in:

Lightwave Technology, Journal of  (Volume:4 ,  Issue: 3 )

Date of Publication:

Mar 1986

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.