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Reliability of semiconductor lasers and detectors for undersea transmission systems

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5 Author(s)
Nakano, Yoshinori ; NTT Public Corp., Atsugi-shi, Kanagawa, Japan ; Sudo, H. ; Iwane, Genzo ; Matsumoto, T.
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This paper reports the strategy for establishing the reliability assurance for LD's and APD's available for undersea transmission systems. On the basis of aging data during more than 104h and a statistical analysis for the reliability of semiconductor devices, the LD's and Ge-APD's lifetest plans for high reliability assurance are proposed.

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Lightwave Technology, Journal of  (Volume:2 ,  Issue: 6 )