By Topic

Low-loss wavelength division multiplexing (WDM) devices for single-mode systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Lipson, J. ; Bell Telephone Laboratories, Inc., Allentown, PA, USA ; Harvey, George T.

We report here on single-mode microoptic wavelength division multiplexing (WDM) devices with two channels located at 1275 and 1345 nm, respectively. Data are presented for four multiplexers and four demultiplexers. The average insertion loss for the multiplexers was 0.5 ± 0.2 and 1.0 ± 0.3 dB for the short and long wavelength channels, respectively. For the demultiplexers, the average losses were 0.8 ± 0.2 dB and 1.0 ± 0.1 dB, respectively. The full channel widths of the demultiplexers for 0.5 dB of additional loss were about 22 nm. All measurements included the presence of prototype precision single-mode connectors. The multiplexers were based on interference filters and GRIN lenses with identical single-mode fibers used for inputs and output. The demultiplexers employed diffraction gratings and GRIN lenses with 50- μm core graded-index output fibers. In addition three of the demultiplexers included a third output channel centered at 1521 nm. The 28- dB dynamic range of the monochromator-based test appartus was insufficient to evaluate the crosstalk performance. Measurements on two demultiplexers, using a 1295-nm laser, yielded values of -33 and -38 dB, respectively for the crosstalk in the 1345-nm channel.

Published in:

Lightwave Technology, Journal of  (Volume:1 ,  Issue: 2 )