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Economic effects in design and test

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4 Author(s)
Dear, I.D. ; Brunel Univ., Uxbridge, UK ; Dislis, C. ; Ambler, A.P. ; Dick, J.

The authors argue that because of misconceptions and myths about the cost of test, many devices and systems are inadequately tested. Focusing on application-specific integrated circuits (ASICs), the authors discuss the economics of test and show how economic analysis leads to test that pays back. The EVEREST test strategy planner, a design tool that aids in the selection of design-for-testability structures during ASIC design and uses cost as a primary selection parameter, is presented.<>

Published in:

Design & Test of Computers, IEEE  (Volume:8 ,  Issue: 4 )