By Topic

Generation of extreme ultraviolet radiation at 79 nm by sum frequency mixing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Srinivasan, T. ; Dept. of Physics, University of Illinois, Chicago, IL, USA ; Egger, H. ; Pummer, H. ; Rhodes, C.

High brightness tunable coherent extreme ultraviolet (XUV) radiation at 79 nm with a peak power of ∼200 mW has been generated in H2gas by sum frequency mixing of two quanta from a high spectral brightness ArF* (193 nm) source with one quantum from a tunable dye laser (∼436 nm). Spectroscopic application of this radiation has been demonstrated by observation of a broad (∼160 cm-1) autoionizing structure in Ar and narrow (∼2 cm-1) autoionizing features in D2. An analysis is given which identifies the dominant molecular states involved in the nonlinear susceptibility of the medium (H2). The frequency independent tuning behavior of the 79 nm output power observed over ∼300 cm-1is related to the molecular structure and response of the nonlinear medium in the intense optical field.

Published in:

Quantum Electronics, IEEE Journal of  (Volume:19 ,  Issue: 8 )