Cart (Loading....) | Create Account
Close category search window

Quantitative intensity measurements using a soft X-ray streak camera

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Kauffman, Robert L. ; Lawrence Livermore National Lab., Livermore, CA, USA ; Stradling, G. ; Attwood, David T. ; Medecki, H.

A soft X-ray streak camera (SXRSC) has been calibrated in order to make absolute flux measurements of X-rays emitted from laser-produced plasmas. The SXRSC developed at the Lawrence Livermore National Laboratory and described in a companion paper in this issue is used to time-resolve X-ray pulses to better than 20 ps. The SXRSC uses an Au photocathode on a thin carbon substrate which is sensitive to X-rays from 100 eV to greater than 10 keV. Calibrations are done in the dynamic mode using a small laser-produced X-ray source. The SXRSC is calibrated by comparing its integrated signal to the output of calibrated X-ray diodes monitoring the source strength. Details of the experiment along with data from a typical calibration are presented. The measured SXRSC intensity response is linear over greater than two orders of magnitude. Using these calibrations, absolute intensities can be measured to an accuracy of ± 30 percent. An example of its use as a flux monitoring device is presented.

Published in:

Quantum Electronics, IEEE Journal of  (Volume:19 ,  Issue: 4 )

Date of Publication:

Apr 1983

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.