By Topic

Growth and characterization of 1.3 µm CW GaInAsP/InP lasers by liquid-phase epitaxy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ng, W.W. ; Electronic Research Center, Rockwell International, Thousand Oaks, CA, USA ; Dapkus, P.D.

The variation of the threshold current density and its temperature dependence with acceptor concentration in GaInAsP/InP lasers emitting at 1.3 μm is described. Mechanisms responsible for the dependence are identified. A model is developed to predict the effect of the above dependence on the CW operation range of these devices. The validity of the model is verified experimentally.

Published in:

Quantum Electronics, IEEE Journal of  (Volume:17 ,  Issue: 2 )