By Topic

Pulsed laser-induced damage to thin-film optical coatings - Part I: Experimental

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Walker, Thomas W. ; Air Force Weapons Laboratory, Kirtland Air Force Base, NM, USA ; Guenther, Arthur H. ; Nielsen, P.

We report a parameteric investigation of the damage threshold and morphology of nine frequently employed dielectric coatings as a function of pulse length (5 and 15 ns), frequency (1.06, 0.53, 0.35, and 0.26 μm), and film thickness. A vidicon camera and computer were used to obtain real-time laser spatial profiles for each testing event. This technique greatly reduced the time required to obtain damage thresholds and enabled a large matrix of data to be obtained. The data and damage morphologies are discussed and several important conclusions are drawn concerning pulsed laser-induced damage to optical materials in thin-film form.

Published in:

Quantum Electronics, IEEE Journal of  (Volume:17 ,  Issue: 10 )