Cart (Loading....) | Create Account
Close category search window
 

On reliable computation with formal neurons

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Venkatesh, S.S. ; Moore Sch. of Electr. Eng., Pennsylvania Univ., Philadelphia, PA, USA ; Psaltis, D.

The authors investigate the computing capabilities of formal McCulloch-Pitts neurons when errors are permitted in decisions. They assume that m decisions are to be made on a randomly specified m set of points in n space and that an error tolerance of εm decision errors is allowed, with 0⩽ε<1/2. The authors are interested in how large an m can be selected such that the neuron makes reliable decisions within the prescribed error tolerance. Formal results for two protocols for error-tolerance-a random error protocol and an exhaustive error protocol-are obtained. The results demonstrate that a formal neuron has a computational capacity that is linear in n and that this rate of capacity growth persists even when errors are tolerated in the decisions

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:14 ,  Issue: 1 )

Date of Publication:

Jan 1992

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.