Cart (Loading....) | Create Account
Close category search window

The dependence of the pulsed 10.6-µm laser damage threshold on the manner in which a sample is irradiated

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bass, M. ; Center for Laser Studies, Univ. of Southern California, Los Angeles, CA, USA ; Leung, K.M.

The threshold for pulsed 10.6 μm laser-induced surface and bulk damage in transparent materials has been shown to depend on the manner in which the samples are irradiated. When a site is irradiated several times, starting at a very low intensity and increasing the flux a few percent on successive shots until damage occurs, the threshold is often higher than if each site were irradiated only once. In addition, it has been shown that the damage threshold also depends on the sample tested and so the use of relative damage-threshold measurements to identify the damage mechanism should be reexamined.

Published in:

Quantum Electronics, IEEE Journal of  (Volume:12 ,  Issue: 2 )

Date of Publication:

February 1976

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.