Cart (Loading....) | Create Account
Close category search window
 

Pseudospark discharges via computer simulation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Boeuf, J.-P. ; Centre de Phys. Atomique de Toulouse, France ; Pitchford, L.C.

A hybrid fluid-particle (Monte Carlo) model to describe the initiation of pseudospark discharges has been developed. In this model, time-dependent fluid equations for the electrons and positive ions are solved self-consistently with Poisson's equation for the electric field in a two-dimensional, cylindrically symmetrical geometry. The Monte Carlo simulation is used to determine the ionization source term in the fluid equations. This model has been used to study the evolution of a discharge in helium at 0.5 torr, with an applied voltage of 2 kV and in a typical pseudospark geometry. From the numerical results, the authors have identified a sequence of physical events that lead to the rapid rise in current associated with the onset of the pseudospark discharge mode. They find that there is a maximum in the electron multiplication at the time which corresponds to the onset of the hollow cathode effect, and although the multiplication later decreases, it is always greater than needed for a steady-state discharge

Published in:

Plasma Science, IEEE Transactions on  (Volume:19 ,  Issue: 2 )

Date of Publication:

Apr 1991

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.