Cart (Loading....) | Create Account
Close category search window

The measurement and data acquisition system for the aging test of the composite insulators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Zha Kunpeng ; China Electr. Power Res. Inst., Beijing, China ; Su Zhiyi

A new measurement and data acquisition system for the aging testing of composite insulators is presented. The system hardware is based on a Dell server and the system software is based on LabView development. The system can realize multi-characteristics monitoring, analyzing and recording in real-time during a 5000 hours aging test of composite insulators. It can separate the leakage current and the pulse current from the aging current; It can alarm, auto-reset or even shutdown when faults occur and can realize the sustainable proceeding of the statistical work of the composite insulators aging test. The measurement and data acquisition system provide a new powerful tool for researching the composite insulators abilities.

Published in:

Power System Technology, 2002. Proceedings. PowerCon 2002. International Conference on  (Volume:3 )

Date of Conference:


Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.