By Topic

On computing reliability-measures of Boolean circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
S. Chakravarty ; State Univ. of New York, Buffalo, NY, USA ; H. B. Hunt

Testability and reliability analyses of Boolean circuits require the computation of the following figures of merit: signal probability, detection probability, signal reliability, as well as signal detectability, signal maskability, and signal unreliability of two-rail and weighted self-checking circuits. The authors present a generic algorithm for computing these measures. Special cases of this generic algorithm compare very favourably with known algorithms for computing some of these measures. An asymptotic analysis of this algorithm is presented. This analysis helps one identify a nontrivial class of problem instances because of all these problems are known to be #P-hard and a polynomial-time algorithm for these problems might not exist

Published in:

IEEE Transactions on Reliability  (Volume:40 ,  Issue: 5 )