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On computing reliability-measures of Boolean circuits

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2 Author(s)
Chakravarty, S. ; State Univ. of New York, Buffalo, NY, USA ; Hunt, H.B., III

Testability and reliability analyses of Boolean circuits require the computation of the following figures of merit: signal probability, detection probability, signal reliability, as well as signal detectability, signal maskability, and signal unreliability of two-rail and weighted self-checking circuits. The authors present a generic algorithm for computing these measures. Special cases of this generic algorithm compare very favourably with known algorithms for computing some of these measures. An asymptotic analysis of this algorithm is presented. This analysis helps one identify a nontrivial class of problem instances because of all these problems are known to be #P-hard and a polynomial-time algorithm for these problems might not exist

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Reliability, IEEE Transactions on  (Volume:40 ,  Issue: 5 )