Cart (Loading....) | Create Account
Close category search window
 

Temperature dependence of critical current density for Nb3Sn and Nb + 60 wt% Ti superconducting alloys

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Benz, M.G. ; General Electric Corporate Research and Development Center, Schenectady, N.Y.

The J-H-T critical surface has been measured at temperatures near 4.2 K for diffusion-processed Nb3Sn and for Nb+60 wt % Ti superconducting alloys. The apparatus used for these measurements consists of a split Nb3Sn superconducting solenoid capable of fields up to 65 kOe, a 4-probe potentiometric sample holder capable of carrying currents up to 1000 A, and an enclosed cryostat which allowed one to vary the temperature of the coil and the sample from 3.4 to 4.8 K by varying the pressure over the liquid helium. Data are presented for the critical current density Jcand for the temperature dependence of critical current density (partialJ_{c}/partialT) observed at 4.2 K. From these data, the values for the two stability parameters of interest, the fractional temperature dependence of critical current density [-(1/J_{c}) (partialJ_{c}/partialT)] and the stability parameterJ_{c}^{2} [-(1/J_{c})(partialJ_{c}/partialT)], were calculated and are presented along with an estimate of the wire diameter required for adiabatic stabilization.

Published in:

Magnetics, IEEE Transactions on  (Volume:8 ,  Issue: 3 )

Date of Publication:

Sep 1972

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.