Cart (Loading....) | Create Account
Close category search window
 

Influence of coercive force on low-frequency creep in bloch-wall permalloy films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kusuda, T. ; Hiroshima, University, Hiroshima, Japan ; Bourne, Henry C. ; Bartran, David S.

A very high resolution Bitter pattern technique is used to observe the motion of Bloch walls in Permalloy films excited by slowly rising and slowly falling hard-axis fields. For low coercive force films, the basic motion consists of approximately equal and opposite jumps induced by simultaneous wall structure changes at two transition fields. Net motion begins with the application of small easy-axis bias fields. For high coercive force films, although the wall structure changes continue to occur, the wall jumps and a net displacement do net occur until the easy-axis bias field exceeds a certain critical value which is a function of the wall coercive force.

Published in:

Magnetics, IEEE Transactions on  (Volume:7 ,  Issue: 1 )

Date of Publication:

Mar 1971

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.